E3S Web of Conferences (Jan 2017)

Low Side Gan Fet Driver for Space Applications

  • Mansilla O. E.,
  • Broline J.,
  • Satterfied H.,
  • Pearce L. G.,
  • Thomson E. J.

DOI
https://doi.org/10.1051/e3sconf/20171612006
Journal volume & issue
Vol. 16
p. 12006

Abstract

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This paper reports the results of preliminary single event effects (SEE) testing of the Intersil ISL70040SEH, a single low side driver specifically designed to drive enhancement mode power GaN FETs.