First GD-OES results on various deuterium ion fluences implanted in tungsten

Abstract

Glow discharge optical emission spectroscopy (GD-OES) was used to investigate the deep depth profile of deuterium in tungsten exposed to deuterium ions at various fluences. Deuterium was found to continue to decrease in intensity at depths 10–20 µm, even at the lowest fluences, well beyond the probing depths of conventional deuterium measurement techniques. The detection sensitivity was sufficient to allow for definite separation in spectra for all fluences used in the present experiments. The integrated deuterium signal from GD-OES measurement was compared with total deuterium content for samples implanted with deuterium with fluences ranging from 1.0 × 1020 D/m2 to 1.0 × 1022 D/m2. The result showed a clear trend, where the intensity scales with implanted deuterium fluence to the 0.25 power. These results motivate further experiments and calibration of the system for future absolute retention measurements using GD-OES. Keywords: Deuterium, Tungsten, Diffusion, Glow discharge optical emission spectroscopy