Some Aspects of Hot Carrier Photocurrent across GaAs <i>p</i>-<i>n</i> Junction

Abstract

The photocurrent across crystalline GaAs p-n junction induced by Nd:YAG laser radiation was investigated experimentally. It is established that the displacement current is dominant at reverse and low forward bias voltages in the case of pulsed excitation. This indicates that hot carriers do not have enough energy to overcome the p-n junction until the forward bias significantly reduces the potential barrier. At a sufficiently high forward bias, the photocurrent is determined by the diffusion of hot carriers across the p-n junction. The current–voltage (I-V) characteristics measured at different crystal lattice temperatures show that the heating of carriers by laser radiation increases with a drop in crystal lattice temperature. This study proposes a novel model for evaluating carrier temperature based on the temperature coefficient of the I-V characteristic. It is demonstrated that the heating of carriers by light diminishes the conversion efficiency of a solar cell, not only through thermalisation but also because of the conflicting interactions between the hot carrier and conventional photocurrents, which exhibit opposite polarities. These findings contribute to an understanding of hot carrier phenomena in photovoltaic devices and may prompt a revision of the intrinsic losses in solar cells.

Keywords

• GaAs
• hot carriers
• temperature coefficient
• hot carrier temperature
• <i>p-n</i> junction
• solar cell