Hangkong bingqi (Oct 2022)

Research on Accelerated Life Test Method for Electrical Assembly Device of Carrier-Borne Aircraft Missile Based on Use Process

  • Yang Zhihong, Di Peng, Fan Ye, Chen Jinhu

DOI
https://doi.org/10.12132/ISSN.1673-5048.2022.0075
Journal volume & issue
Vol. 29, no. 5
pp. 83 – 87

Abstract

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With the rise of use requirements, carrier-borne aircraft missile is facing the problem of long-term use under the blend of storage on land and on-board duty tasks. Taking the electrical assembly device of carrier-borne aircraft missile as the research object, the environmental characteristics of electrical assembly device of carrier-borne aircraft missile in the use process is analyzed, the accelerated model of assembly device under combined stress is established, the section of accelerated life test based on use process is designed, and the corresponding method of accelerated life test is proposed. Taking an inertial navigation module as an example, the use process is accelerated and verified, and the performance degradation of the equipment is successfully stimulated, which verifies the effectiveness of the proposed method.

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