Informacije MIDEM (Nov 2020)

Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method

  • N. Mitrović,
  • D. Danković,
  • B. Ranđelović,
  • Z. Prijić,
  • N. Stojadinović

DOI
https://doi.org/10.33180/InfMIDEM2020.305
Journal volume & issue
Vol. 50, no. 3
pp. 205 – 214

Abstract

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