Surface State Passivation and Optical Properties Investigation of GaSb via Nitrogen Plasma Treatment

• Xuan Fang,
• Zhipeng Wei,
• Dan Fang,
• Xueying Chu,
• Jilong Tang,
• Dengkui Wang,
• Xinwei Wang,
• Jinhua Li,
• Yongfeng Li,
• Bin Yao,
• Xiaohua Wang,
• Rui Chen

Affiliations

Xuan Fang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Zhipeng Wei

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Dan Fang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Xueying Chu

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Jilong Tang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Dengkui Wang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Xinwei Wang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Jinhua Li

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Yongfeng Li

Key Laboratory of Physics and Technology for Advanced Batteries, Ministry of Education, College of Physics, Jilin University, Changchun, P. R. China

Bin Yao

Key Laboratory of Physics and Technology for Advanced Batteries, Ministry of Education, College of Physics, Jilin University, Changchun, P. R. China

Xiaohua Wang

State Key Laboratory of High Power Semiconductor Lasers, School of Science, Changchun University of Science and Technology, Changchun, P. R. China

Rui Chen

Department of Electrical and Electronic Engineering, South University of Science and Technology of China, Shenzhen, Guangdong, P. R. China