Lead-trihalide perovskite solar cells are an important photovoltaic technology. We investigate the effect of light induced degradation on perovskite solar cells. During exposure, the open-circuit voltage (Voc) of the device increases, whereas the short-circuit current (Isc) shows a decrease. The degradation can be completely recovered using thermal annealing in dark. We develop a model based on light induced generation of ions and migration of these ions inside the material to explain the changes in Isc, Voc, capacitance and dark current upon light exposure and post-exposure recovery. There was no change in defect density in the material upon exposure.
