Angle Resolved Scattering Measurement of Multiple Spherical Particles by Fourier Transform

Abstract

In this paper, we report that the far field diffraction pattern of a specimen which is consisting of an array of spherical particles enables the determination of the size and refractive index of each scattering sphere. The far field 2D angular resolved diffraction pattern, of which the diffraction angle reaches tens of degrees, is measured by CCD camera. On one hand, the diffraction pattern distorted obviously at high angles is corrected for curvature. The amplitude and phase images of the specimen are reconstructed by difference map iterative algorithm. The size of each scattering microsphere is calculated according to its pixel numbers and the image resolution. On the other hand, the diffraction pattern without curvature correction is used to reconstruct the amplitude and phase images of the specimen by HIO algorithm. The amplitude and phase images of each sphere are isolated. Then the angular resolved scattering signals of the individual spheres are quantitatively indicated by Fourier transform. Finally, the refractive index of each microsphere is obtained by fitting the experimental results using Mie theory.

Keywords

• Scattering measurements
• scattering particles