IEEE Journal of the Electron Devices Society (Jan 2015)

Silicon Carbide (SiC) Nanoelectromechanical Antifuse for Ultralow-Power One-Time-Programmable (OTP) FPGA Interconnects

  • Tina He,
  • Fengchao Zhang,
  • Swarup Bhunia,
  • Philip X.-L. Feng

DOI
https://doi.org/10.1109/JEDS.2015.2421301
Journal volume & issue
Vol. 3, no. 4
pp. 323 – 335

Abstract

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We report a new nanoscale antifuse featuring low-power and high-programming speed, by employing silicon carbide (SiC) nanoelectromechanical systems (NEMS). We show that the SiC NEMS antifuses can enable ultralow-power one-time-programmable (OTP) field-programmable gate arrays (FPGAs) with characteristics promising for security-sensitive and harsh-environment applications. The SiC NEMS antifuses offer minimal leakage, low-programming voltage (down to ~1.5 V), ideally abrupt transient, high on/off ratios (>107) and high-current carrying ability (>106 A/cm2), and very small footprints (~1 μm2 to ~0.1 μm2 per device). We further describe new designs of antifuses, simulate FPGA benchmarking circuits based on experimentally demonstrated practical NEMS antifuses, and compare their advantageous performance with state-of-the-art conventional antifuse FPGAs. We also demonstrate a SiC NEMS antifuse-based OTP memory cell with a read margin of >106.

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