Entails of accumulated genes for resistance to Puccinia triticina

Abstract

Five gene species effected AGR (adult plant parts growth ratios) values: low, medium or high increasable and low = LLP (prolonged latency period to Puccinia triticina) or high decreaseable = FRAGR. All were introduced by backcrossing as leaf rust resistance genes (Lr) in variety Thatcher (Lr Tc or Lr 22b). Only from LLP group single or accumulated were able to prolong latency period (LP) with or without lower reaction type at average air temperature around 20°C. According presented results the prolonged LLP was durable character at last on low level as lower maximal infection severity in field (MIS) decrease was according to high AGR express able genes or their accumulations. Results of HAGR+LLP single genes accumulations in Thatcher were even more effective according to MIS in Serbia. Organized usage of certain number of different Lr genes between regions and regionally could produce enough durable resistance on the higher level and open the rotation possibility. Many previous solutions leaded to missed variety type and in humid and more humid semiarid regions linked lower grain yield and Pyrenophora tritici repentis toxic proteins accumulation. .

Keywords

• Lr genes
• cultivar
• wheat
• leaf rust
• durable resistance