Nanomaterials (Jan 2023)

Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling

  • Hao-Tian Zhang,
  • Rong He,
  • Lei Peng,
  • Yu-Ting Yang,
  • Xiao-Jie Sun,
  • Yu-Shan Zhang,
  • Yu-Xiang Zheng,
  • Bao-Jian Liu,
  • Rong-Jun Zhang,
  • Song-You Wang,
  • Jing Li,
  • Young-Pak Lee,
  • Liang-Yao Chen

DOI
https://doi.org/10.3390/nano13030383
Journal volume & issue
Vol. 13, no. 3
p. 383

Abstract

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It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz–Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis.

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