Journal of Telecommunications and Information Technology (Jun 2023)

Large-Signal RF Modeling with the EKV3 MOSFET Model

  • Maria-Anna Chalkiadaki ,
  • Matthias Bucher

DOI
https://doi.org/10.26636/jtit.2010.1.1060
Journal volume & issue
no. 1

Abstract

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This paper presents a validation of the EKV3 MOSFET model under load-pull conditions with high input power at 5.8 GHz, as well as S-parameter measurements with low input power up to 20 GHz. The EKV3 model is able to represent coherently the large- and small-signal RF characteristics in advanced 90 nm CMOS technology. Multifinger devices with nominal drawn gate length of 70 nm are used.

Keywords