Opto-Electronic Advances (Dec 2023)

Deep learning enabled single-shot absolute phase recovery in high-speed composite fringe pattern profilometry of separated objects

  • Maciej Trusiak,
  • Malgorzata Kujawinska

DOI
https://doi.org/10.29026/oea.2023.230172
Journal volume & issue
Vol. 6, no. 12
pp. 1 – 4

Abstract

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A recent article in the Opto-Electronic Advances (OEA) journal from Prof. Qian Chen and Prof. Chao Zuo’s group introduced a new and efficient 3D imaging system that captures high-speed images using deep learning-enabled fringe projection profilometry (FPP). In this News & Views article, we explore potential avenues for future advancements, including expanding the measurement range through an extended number-theoretical approach, enhancing quality through the incorporation of horizontal fringes, and integrating data from other modalities to broaden the system's applications.