Near-Infrared Triggered Degradation for Transient Electronics

• Emin Istif,
• Mohsin Ali,
• Elif Yaren Ozuaciksoz,
• Yagız Morova,
• Levent Beker

Affiliations

Emin Istif

Department of Molecular Biology and Genetics, Faculty of Engineering and Natural Science, Kadir Has University, Istanbul, Turkey

Mohsin Ali

Department of Biomedical Sciences and Engineering, Koç University, Sarıyer, Istanbul, Turkey

Elif Yaren Ozuaciksoz

Department of Biomedical Sciences and Engineering, Koç University, Sarıyer, Istanbul, Turkey

Yagız Morova

Koç University Surface Science and Technology Center (KUYTAM), Istanbul, Turkey

Levent Beker

Department of Mechanical Engineering, Koç University, Sarıyer, Istanbul, Turkey