Detecting Contaminants in Water Based on Full Scattering Profiles within the Single Scattering Regime

• Alon Tzroya,
• Shoshana Erblich,
• Hamootal Duadi,
• Dror Fixler

Affiliations

Alon Tzroya

The Faculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, Israel

Shoshana Erblich

School of Engineering, Rutgers University, New Brunswick, New Jersey, United States

Hamootal Duadi

The Faculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, Israel

Dror Fixler

The Faculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, Israel