Bridging sheet size controls densification of MXene films for robust electromagnetic interference shielding
Bin Xia,
Zhe Wang,
Tingting Wang,
Shuaishuai Chen,
Han Wu,
Binbin Zhang,
Yunfa Si,
Zibo Chen,
Bao-Wen Li,
Zongkui Kou,
Daping He
Affiliations
Bin Xia
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China
Zhe Wang
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China
Tingting Wang
School of Mathematical & Physical Sciences, Wuhan Textile University, Wuhan 430200, China
Shuaishuai Chen
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China
Han Wu
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China
Binbin Zhang
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China
Yunfa Si
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China
Zibo Chen
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China
Bao-Wen Li
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China
Zongkui Kou
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China; Corresponding author
Daping He
Hubei Engineering Research Center of RF-Microwave Technology and Application, School of Science, Wuhan University of Technology, Wuhan 430070, China; State Key Laboratory of Silicate Materials for Architectures, Wuhan University of Technology, Wuhan 430070, China; Corresponding author
Summary: Numerous voids among the incompact layer-structure of MXene films result in their low ambient stability and poor innate conductivity for electromagnetic interference (EMI) shielding. Herein, we report a bridging-sheet-size-controlled densification process of MXene films by applying graphene oxide (GO) as a bridging agent. Specifically, the sheet size of GO is tailored to quantify a negative correlation of sheet size with densification for directing the preparation of most compact MXene-GO films. Benefiting from the shortest electron-transport-distance in the most compact structure, the conductivity of the MXene-GO film achieves 1.7 times (∼1.6 × 105 S/m) that of MXene film. The EMI shielding performance (5.2 × 106 dB/m) reaches the record-value among reported MXene films at 10 μm-scale thickness. Moreover, the compact structure boosts the ambient stability of MXene-GO films where the conductivity and EMI shielding performance remain 88.7% and 90.0% after 15 days, respectively. The findings rationale the structure-activity relationship of compact MXene films for flexible electronics.
