Nanophotonics
(Sep 2019)
Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
Jahan Nusrat,
Wang Hanwei,
Zhao Shensheng,
Dutta Arkajit,
Huang Hsuan-Kai,
Zhao Yang,
Chen Yun-Sheng
Affiliations
Jahan Nusrat
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Wang Hanwei
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Zhao Shensheng
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Dutta Arkajit
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Huang Hsuan-Kai
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Zhao Yang
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
Chen Yun-Sheng
Department of Electrical and Computer Engineering, University of Illinois Urbana Champaign, Urbana, IL61801, USA
DOI
https://doi.org/10.1515/nanoph-2019-0181
Journal volume & issue
Vol. 8,
no. 10
Abstract
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Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.
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