Nature Communications (Apr 2020)

Deep learning enables structured illumination microscopy with low light levels and enhanced speed

  • Luhong Jin,
  • Bei Liu,
  • Fenqiang Zhao,
  • Stephen Hahn,
  • Bowei Dong,
  • Ruiyan Song,
  • Timothy C. Elston,
  • Yingke Xu,
  • Klaus M. Hahn

DOI
https://doi.org/10.1038/s41467-020-15784-x
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 7

Abstract

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Super-resolution microscopy typically requires high laser powers which can induce photobleaching and degrade image quality. Here the authors augment structured illumination microscopy (SIM) with deep learning to reduce the number of raw images required and boost its performance under low light conditions.