RIETVELD TEXTURE REFINEMENT ANALYSIS OF LINDE TYPE A ZEOLITE FROM X-RAY DIFFRACTION DATA

Abstract

Rietveld method was used to conduct a texture refinement analysis for Linde type A zeolite prepared by hydrothermal conditions of 100 ºC for 4 h. Material Analysis Using Diffraction software, which is an open access/user-friendly software, was used to accomplish the analysis using the observed X-ray diffraction data. This study shows the feasibility of using Material Analysis Using Diffraction software for zeolite analysis because it has not been applied for zeolite before. Implementation of this software for the texture refinement analysis for zeolite can contributes to the field of zeolite preparation in term of adding more reliability to the experimental results. The X-ray diffraction results of the prepared zeolite concur well with the standard Linde type A zeolite. All parameters calculated by Rietveld refinement method for the prepared zeolite were close enough to those for the standard zeolite A. Also, ImageJ software was used for image analysis to obtain the average particle size for zeolite A sample.

Keywords

• Characterization
• Crystal structure
• Linde type A zeolite
• Rietveld method
• Texture analysis
• X-ray diffraction