Image Analysis and Stereology (May 2011)

MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD

  • Patricia Donnadieu,
  • Kenji Matsuda,
  • Thierry Epicier,
  • Joel Douin

DOI
https://doi.org/10.5566/ias.v20.p213-218
Journal volume & issue
Vol. 20, no. 3
pp. 213 – 218

Abstract

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Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys. Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). The strain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix.

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