Experimental Evidence of the Impact of Nitrogen on Carrier Capture and Escape Times in InGaAsN/GaAs Single Quantum Well

Lifang Xu; Dinesh Patel; Carmen S. Menoni; Jeng-Ya Yeh; Luke J. Mawst; Nelson Tansu

doi:10.1109/JPHOT.2012.2230251

IEEE Photonics Journal (Jan 2012)

Experimental Evidence of the Impact of Nitrogen on Carrier Capture and Escape Times in InGaAsN/GaAs Single Quantum Well

Lifang Xu,
Dinesh Patel,
Carmen S. Menoni,
Jeng-Ya Yeh,
Luke J. Mawst,
Nelson Tansu

Affiliations

Lifang Xu: <formula formulatype="inline"><tex Notation="TeX">$^{1}$</tex></formula>Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO, USA
Dinesh Patel: Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO, USA
Carmen S. Menoni: Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, CO, USA
Jeng-Ya Yeh: <formula formulatype="inline"><tex Notation="TeX">$^{2}$</tex></formula>Reed Center for Photonics, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA
Luke J. Mawst: Reed Center for Photonics, Department of Electrical & Computer Engineering, University of Wisconsin-Madison, Madison, WI, USA
Nelson Tansu: <formula formulatype="inline"><tex Notation="TeX">$^{3}$</tex></formula>Center for Photonics and Nanoelectronics, Department of Electrical and Computer Engineering, Lehigh University , Bethlehem, PA, USA

DOI: https://doi.org/10.1109/JPHOT.2012.2230251
Journal volume & issue: Vol. 4, no. 6
pp. 2262 – 2271

Abstract

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We report our experimental results and theoretical analysis on carrier escape time in In0.4Ga0.6As1 -yNy/GaAs (y = 0; 0.005) ridge waveguide single-quantum-well (QW) lasers with N-contents of 0% and 0.5%. The experiments were carried out by using novel time-resolved two-color pump-probe transmission measurements. Our results show a significant decrease of carrier escape time with nitrogen incorporation in the InGaAsN QW, which agrees well with the values obtained from the theoretical calculation based on thermally activated hole leakage. The measurement results provide experimental supports for hole leakage theory.

Published in IEEE Photonics Journal

ISSN: 1943-0655 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics; Science: Physics: Optics. Light
Website: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4563994

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