Nature Communications (Mar 2020)

Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory

  • Sunil Rana,
  • João Mouro,
  • Simon J. Bleiker,
  • Jamie D. Reynolds,
  • Harold M. H. Chong,
  • Frank Niklaus,
  • Dinesh Pamunuwa

DOI
https://doi.org/10.1038/s41467-020-14872-2
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 10

Abstract

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Designing reliable, scalable and energy efficient data storage systems that can operate in extreme temperatures, remains a challenge. Here, the authors demonstrate a nanoelectromechanical relay that does not exhibit pull-in instability for reliable reprogrammable non-volatile memory operation.