Hyperspectral microscopy of two-dimensional semiconductors

Abstract

Here we present an interferometric wide field hyperspectral microscope based on a common-path birefringent interferometer with translating wedges, to measure photoluminescence emission from two-dimensional semiconductors. We show diffraction-limited hyperspectral photoluminescence microscopy from two-dimensional materials across millimeter areas, proving that our hyperspectral microscope is a compact, stable and fast tool to characterize the optical properties and the morphology of 2D materials across ultralarge areas.

Keywords

• Transition metal dichalcogenides
• Hyperspectral imaging
• Photoluminescence
• Strain
• Machine vision