The Impact and Correction of Sensitive Environmental Factors on Spectral Reflectance Measured In Situ

Abstract

The spectral reflectance measured in situ is often regarded as the “truth” of objects, which plays an important role in Earth observation applications. However, in situ measurements are influenced by several factors such as atmospheric conditions, illumination and view geometry (I&VG), cloud coverage, and adjacency effects. In order to avoid the influence of these factors, in situ measurements are usually carried out under sunny days and close to noon. However, the impact of I&VG is still present in most cases. At present, people still know little about the influence mechanism of I&VG. Moreover, correcting the impact of I&VG is also a problem that needs to be urgently solved in reflectance spectroscopy. In this work, experiments are carried out using the multi-directional hyperspectral remote sensing simulation facility (MHSRS2F), which allows adjustment and control of the I&VG parameters. This paper proposes an uncertainty evaluation model for I&VG and quantifies the uncertainty caused by different I&VG parameters. Then, the sensitivity of reflectance to I&VG at different wavelengths is explored based on uncertainty models. Finally, a correction model for reflectance under different I&VG conditions is proposed. The results reveal that the uncertainty and sensitivity caused by observation height are relatively high, regardless of the surface heterogeneity. It directly affects the size of the field of view and the physicochemical characteristics of the object. For objects that approximate the Lambertian surface, more attention should be paid to the selection and variation of solar and view zenith angles and view azimuth angles. For objects with surface heterogeneity, the selection and variation of solar azimuth angle, view azimuth angle, and solar zenith angle are more crucial. The correction model proposed in this paper has a 41.25% correction effect on different view zenith angles, but the correction effect on other environmental factors is not significant.

Keywords

• in situ measurements
• environmental factors
• illumination and view geometry (I&VG)
• standard uncertainty
• sensitivity analysis
• spectral reflectance correction