Dynamic Speckle Illumination Digital Holographic Microscopy by Doubly Scattered System
Yun Liu,
Peihua Bu,
Mingxing Jiao,
Junhong Xing,
Ke Kou,
Tianhong Lian,
Xian Wang,
Yumeng Liu
Affiliations
Yun Liu
Key Lab of NC Machine Tools and Integrated Manufacturing Equipment of the Education Ministry & Key Lab of Mechanical Manufacturing Equipment of Shaanxi Province, Xi’an University of Technology, Xi’an 710048, China
Peihua Bu
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Mingxing Jiao
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Junhong Xing
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Ke Kou
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Tianhong Lian
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Xian Wang
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
Yumeng Liu
School of Mechanical and Precision Instrument Engineering, Xi’an University of Technology, Xi’an 710048, China
The coherent noise always exists in digital holographic microscopy due to the laser source, degrading the image quality. A method of speckle suppression using the dynamic speckle illumination, produced by double-moving diffusers, is presented in digital holographic microscopy. The space–time correlation functions are theoretically analyzed from the statistics distribution in the doubly and singly scattered system, respectively. The configuration of double-moving diffusers is demonstrated to have better performance in speckle suppression compared with the single diffuser and moving-static double diffusers cases. The experiment results verify the feasibility of the approach. The presented approach only requires a single shot interferogram to realize the speckle reduction, accordingly it has the potential application in real-time measurement.
