Science and Technology of Advanced Materials: Methods (Dec 2022)

End-condition for solution small angle X-ray scattering measurements by kernel density estimation

  • Hiroshi Sekiguchi,
  • Noboru Ohta,
  • Hideaki Ishibashi,
  • Hideitsu Hino,
  • Masaichiro Mizumaki

DOI
https://doi.org/10.1080/27660400.2022.2140021
Journal volume & issue
Vol. 2, no. 1
pp. 426 – 434

Abstract

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We develop a method for calculating the minimum X-ray exposure time for X-ray solution scattering experiments using statistical and mathematical approaches to enhance the measurement efficiency while maintaining data quality. Experts can determine the X-ray exposure time for samples by investigating time-series data of scattering profiles and considering the quality of scattering profiles and the samples’ X-ray damage. In this study, we apply a statistical inequality to estimate the kernel density estimation method’s error to determine the minimum X-ray exposure time for protein solution scattering experiments and evaluate the method’s validity using the results of Guinier analysis as an indicator.

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