Sequential Growth of 2D/3D Double‐Layer Perovskite Films with Superior X‐Ray Detection Performance

Abstract

Abstract Perovskite materials in different dimensions show great potential in direct X‐ray detection, but each with limitations stemming from its own intrinsic properties. Particularly, the sensitivity of two‐dimensional (2D) perovskites is limited by poor carrier transport while ion migration in three‐dimensional (3D) perovskites causes the baseline drifting problem. To circumvent these limitations, herein a double‐layer perovskite film is developed with properly aligned energy level, where 2D (PEA)2MA3Pb4I13 (PEA=2‐phenylethylammonium, MA=methylammonium) is cascaded with vertically crystallized 3D MAPbI3. In this new design paradigm, the 3D layer ensures fast carrier transport while the 2D layer mitigates ion migration, thus offering a high sensitivity and a greatly stabilized baseline. Besides, the 2D layer increases the film resistivity and enlarges the energy barrier for hole injection without compromising carrier extraction. Consequently, the double‐layer perovskite detector delivers a high sensitivity (1.95 × 104 μC Gyair−1 cm−2) and a low detection limit (480 nGyair s−1). Also demonstrated is the X‐ray imaging capacity using a circuit board as the object. This work opens up a new avenue for enhancing X‐ray detection performance via cascade assembly of various perovskites with complementary properties.

Keywords

• direct X‐ray detection
• interfacial engineering
• low‐dimensional perovskites