Remote Sensing (Jul 2022)

Reflectance Anisotropy from MODIS for Albedo Retrieval from a Single Directional Reflectance

  • Hu Zhang,
  • Mengzhuo Zhao,
  • Ziti Jiao,
  • Yi Lian,
  • Lei Chen,
  • Lei Cui,
  • Xiaoning Zhang,
  • Yan Liu,
  • Yadong Dong,
  • Da Qian,
  • Yiting Wang,
  • Juan Li,
  • Tiejun Cui

DOI
https://doi.org/10.3390/rs14153627
Journal volume & issue
Vol. 14, no. 15
p. 3627

Abstract

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Surface reflectance anisotropy and insufficient multi-angular observations are the main challenges in albedo estimation from satellite observations. Numerous studies have been developed for albedo retrieval from a single directional reflectance by associating the anisotropy information extracted from coarse-resolution bidirectional-reflectance distribution function (BRDF) data. The contribution of land-cover type (LCT) and the Normalized Difference Vegetation Index (NDVI) in distinguishing reflectance anisotropy in these methods remains controversial. This study first proposed an approach to extracting a priori BRDF (F) from the MODIS BRDF/albedo product by considering the distribution characteristics of the model parameters. LCT- and NDVI-based F were also extracted from the corresponding subset. Then, the F-based albedo was derived from simulated or satellite directional reflectance and the anisotropic information of F. Finally, the directional reflectance and F-based albedo were compared with the MODIS albedo or ground measurement, in order to show the ability of F to compensate for the effect of reflectance anisotropy in the albedo retrieval process. The method was fully validated by the global and time-series MODIS BRDF data. The results showed that reflectance anisotropy has an aggregated distribution pattern, and F can represent the reflectance anisotropy of most pixels within a tile. The improvement of LCT and NDVI only occurs when the tile contains a large area of vegetated and barren ground. With the exception of the hotspot and large viewing-zenith-angle area in the forward hemisphere, the F-based shortwave albedo has high consistency with the MODIS albedo product. A comparison with the ground measurements and MODIS albedo showed that the F-based albedo from a single directional reflectance generally achieves an absolute accuracy requirement, with a root-mean-square error (RMSE) of 0.027 and 0.036.

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