Nature Communications (Nov 2020)

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

  • Mario Lanza,
  • Quentin Smets,
  • Cedric Huyghebaert,
  • Lain-Jong Li

DOI
https://doi.org/10.1038/s41467-020-19053-9
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 5

Abstract

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The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.