Electronics (Jan 2023)

Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning

  • Florindo Bevilacqua,
  • Francesco D’Agostino,
  • Flaminio Ferrara,
  • Claudio Gennarelli,
  • Rocco Guerriero,
  • Massimo Migliozzi,
  • Giovanni Riccio

DOI
https://doi.org/10.3390/electronics12030542
Journal volume & issue
Vol. 12, no. 3
p. 542

Abstract

Read online

An effective procedure to correct known 3D probe positioning errors affecting the near-field–far-field transformation (NF–FF) with non-conventional plane rectangular scanning, named planar wide-mesh scanning (PWMS), is developed in this paper. It relies on the non-redundant sampling representations of electromagnetic fields and related optimal sampling interpolation (OSI) expansions and has been devised when a quasi-planar antenna under test is considered as suitably modelled by either a double bowl or an oblate spheroid. Such an algorithm first makes use of the so-called k-correction to compensate for the errors occurring when the actual sampling points deviate from the acquisition plane and then adopts an iterative procedure to restore the NF samples at the points specified by the used non-redundant sampling representation from those obtained at the previous step and affected by 2D positioning errors. Finally, once the regularly arranged PWMS samples have been calculated, the NF data required to compute the classic plane-rectangular NF–FF transformation are accurately evaluated by using an effective 2D OSI algorithm. Several numerical results are presented in order to assess the effectiveness of the devised approach.

Keywords