Nanophotonics (Jul 2024)

Flat lens–based subwavelength focusing and scanning enabled by Fourier translation

  • Zhang Xin,
  • Hu Yanwen,
  • Lin Haolin,
  • Yin Hao,
  • Li Zhen,
  • Fu Shenhe,
  • Chen Zhenqiang

DOI
https://doi.org/10.1515/nanoph-2024-0206
Journal volume & issue
Vol. 13, no. 20
pp. 3867 – 3876

Abstract

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We demonstrate a technique for flexibly controlling subwavelength focusing and scanning, by using the Fourier translation property of a topology-preserved flat lens. The Fourier transform property of the flat lens enables converting an initial phase shift of light into a spatial displacement of its focus. The flat lens used in the technique exhibits a numerical aperture of 0.7, leading to focusing the incident light to a subwavelength scale. Based on the technique, we realize flexible control of the focal positions with arbitrary incident light, including higher-order structured light. Particularly, the presented platform can generate multifocal spots carrying optical angular momentum, with each focal spot independently controlled by the incident phase shift. This technique results in a scanning area of 10 μm × 10 μm, allowing to realize optical scanning imaging with spatial resolution up to 700 nm. This idea is able to achieve even smaller spatial resolution when using higher-numerical-aperture flat lens and can be extended to integrated scenarios with smaller dimension. The presented technique benefits potential applications such as in scanning imaging, optical manipulation, and laser lithography.

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