Beilstein Journal of Nanotechnology (Aug 2024)

Signal generation in dynamic interferometric displacement detection

  • Knarik Khachatryan,
  • Simon Anter,
  • Michael Reichling,
  • Alexander von Schmidsfeld

DOI
https://doi.org/10.3762/bjnano.15.87
Journal volume & issue
Vol. 15, no. 1
pp. 1070 – 1076

Abstract

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Laser interferometry is a well-established and widely used technique for precise displacement measurements. In a non-contact atomic force microscope (NC-AFM), it facilitates the force measurement by recording the periodic displacement of an oscillating microcantilever. To understand signal generation in a NC-AFM-based Michelson-type interferometer, we evaluate the non-linear response of the interferometer to the harmonic displacement of the cantilever in the time domain. As the interferometer signal is limited in amplitude because of the spatial periodicity of the interferometer light field, an increasing cantilever oscillation amplitude creates an output signal with an increasingly complex temporal structure. By the fit of a model to the measured time-domain signal, all parameters governing the interferometric displacement signal can precisely be determined. It is demonstrated, that such an analysis specifically allows for the calibration of the cantilever oscillation amplitude with 2% accuracy.

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