APL Materials (Aug 2013)

Strain-induced enhancement of the thermoelectric power in thin films of hole-doped La2NiO4+δ

  • P. L. Bach,
  • J. M. Vila-Fungueiriño,
  • V. Leborán,
  • Elías Ferreiro-Vila,
  • B. Rodríguez-González,
  • F. Rivadulla

DOI
https://doi.org/10.1063/1.4818356
Journal volume & issue
Vol. 1, no. 2
pp. 021101 – 021101

Abstract

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We propose a novel route for optimizing the thermoelectric power of a polaronic conductor, independent of its electronic conductivity. This mechanism is exemplified here in thin-films of La2NiO4+δ. Tensile stress induced by epitaxial growth on SrTiO3 doubles the thermoelectric power of ≈15 nm thick films relative to ≈90 nm films, while the electronic conductivity remains practically unchanged. Epitaxial strain influences the statistical contribution to the high temperature thermopower, but introduces a smaller correction to the electronic conductivity. This mechanism provides a new way for optimizing the high temperature thermoelectric performance of polaronic conductors.