Reflection Interference Spectroscopy Technology Monitoring the Synthesis of ZnCl₂-ZnO Nanosheets on Nanoporous Anodic Alumina Substrate in Real Time

Abstract

In situ, real-time, and non-destructive monitoring of the synthesis of nanomaterials is essence crucial for the development and prospective applications of nanoscience and nanotechnology. Reflection interference spectroscopy technology was used to systematically monitor the synthesis process of a transparent (ZnCl2-ZnO)/NpAA composite film which consists of ZnCl2-ZnO nanosheets formed by ZnCl2 precursor solution on the top surface of the substrate layer of nanoporous anodic alumina. Some significant results are found, e.g., the curve of effective optical thickness with time can be divided into three stages, corresponding to the synthesis process of ZnCl2-ZnO; and more, these films generated from ZnCl2 precursor solution with different concentrations, such as 0.05 M, 0.07 M, 0.085 M, or 0.1 M, can be directly distinguished according to the characteristics of the three stages.

Keywords

• interference spectroscopy
• effective optical thickness
• self-assembly
• double-layer composite film
• non-destructive monitoring