Physical Review Special Topics. Accelerators and Beams (May 2003)

Numerical simulation of the generation of secondary electrons in the High Current Experiment

  • P. H. Stoltz,
  • M. A. Furman,
  • J.-L. Vay,
  • A. W. Molvik,
  • R. H. Cohen

DOI
https://doi.org/10.1103/PhysRevSTAB.6.054701
Journal volume & issue
Vol. 6, no. 5
p. 054701

Abstract

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Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150–200 electrons per ion collision may result in the HCX.