Phases and Interfaces in the Cr–Fe–Si Ternary System: X-ray Diffraction and Electron Microscopy Study
Elena I. Suvorova,
Natalya A. Arkharova,
Anna G. Ivanova,
Fedor Yu. Solomkin,
Philippe A. Buffat
Affiliations
Elena I. Suvorova
A.V. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences, Leninsky pr. 59, Moscow 119333, Russia
Natalya A. Arkharova
A.V. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences, Leninsky pr. 59, Moscow 119333, Russia
Anna G. Ivanova
A.V. Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics” of the Russian Academy of Sciences, Leninsky pr. 59, Moscow 119333, Russia
Fedor Yu. Solomkin
Ioffe Physical Technical Institute of Russian Academy of Sciences, Polytechnic Street, 26, St. Petersburg 194021, Russia
Philippe A. Buffat
Ecole Polytechnique Fédérale de Lausanne, Centre Interdisciplinaire de Microscopie Electronique, CH-1015 Lausanne, Switzerland
The ternary Cr-Fe-Si system was investigated with X-ray diffraction, energy dispersive X-ray spectrometry, scanning and transmission electron microscopy, and electron diffraction. Samples melted at 1723 K were examined right after cooling or after annealing at 1073 K for 3 days to determine phases, grain sizes, and interphase interfaces. During annealing, a polymorphic transformation of the tetragonal α-FeSi2 to the orthorhombic β-FeSi2 phase occurs, while CrSi2 retains its hexagonal structure at high-temperature treatment. Thin layers of ε-FeSi with a cubic structure were observed and identified within the CrSi2 grains. Crystallographic orientation relationships are determined at the interphase interfaces. The contributions of lattice mismatch and thermal expansion coefficient misfit to deformation are discussed.
