Science and Technology of Advanced Materials (Jan 2020)

Resistive switching memory performance in oxide hetero-nanocrystals with well-controlled interfaces

  • Takafumi Ishibe,
  • Yoshiki Maeda,
  • Tsukasa Terada,
  • Nobuyasu Naruse,
  • Yutaka Mera,
  • Eiichi Kobayashi,
  • Yoshiaki Nakamura

DOI
https://doi.org/10.1080/14686996.2020.1736948
Journal volume & issue
Vol. 21, no. 1
pp. 195 – 204

Abstract

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For realization of new informative systems, the memristor working like synapse has drawn much attention. We developed isolated high-density Fe3O4 nanocrystals on Ge nuclei/Si with uniform and high resistive switching performance using low-temperature growth. The Fe3O4 nanocrystals on Ge nuclei had a well-controlled interface (Fe3O4/GeOx/Ge) composed of high-crystallinity Fe3O4 and high-quality GeOx layers. The nanocrystals showed uniform resistive switching characteristics (high switching probability of ~90%) and relatively high Off/On resistance ratio (~58). The high-quality interface enables electric field application to Fe3O4 and GeOx near the interface, which leads to effective positively charged oxygen vacancy movement, resulting in high-performance resistive switching. Furthermore, we successfully observed memory effect in nanocrystals with well-controlled interface. The experimental confirmation of the memory effect existence even in ultrasmall nanocrystals is significant for realizing non-volatile nanocrystal memory leading to neuromorphic devices.

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