Relationship between wheat root properties and its electrical signature using the spectral induced polarization method

Abstract

Abstract Measuring root properties, the “hidden half” of the plant, is challenging due to their heterogeneous and dynamic nature. A promising method for noninvasive mapping of roots and their activity, spectral induced polarization (SIP), has been introduced. However, measurements of root properties together with their SIP responses are missing, limiting the interpretation of a root's SIP signature. In this study, we coupled SIP measurements of roots in hydroponic solution with measurements of root biomass, surface area, and diameter. Furthermore, we monitored the SIP response of roots poisoned by cyanide, which results in depolarization of the root's cell membrane potential. We found a linear correlation between root biomass and surface area, and the low‐frequency electrical polarization. In addition, we demonstrate the relationship between root cell membrane potential and root polarization. Based on the results, we suggest that in comparison with the stem‐based approach used by other researchers, the polarization in the contact‐free method used in this study is related to the external surface area of the root and external architectural structures such as root diameter and root hair. Overall, a direct link between root properties and their electrical signature was established.