Resolving Intrinsic Modulation Spectral Lines from Electro-Optic Modulation Spectra Based on Boosted Iterative Deconvolution
Jian Li,
Ying Xu,
Xinhai Zou,
Junfeng Zhu,
Zhongtao Ruan,
Yali Zhang,
Zhiyao Zhang,
Shangjian Zhang,
Yong Liu
Affiliations
Jian Li
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Ying Xu
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Xinhai Zou
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Junfeng Zhu
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Zhongtao Ruan
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Yali Zhang
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Zhiyao Zhang
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Shangjian Zhang
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Yong Liu
Advanced Research Center for Microwave Photonics (ARC-MWP), State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Optical spectrum analysis is the most direct and effective method for characterizing electro-optic modulation spectra. According to the Rayleigh criterion, the best resolution of an optical spectrum analysis is limited by the point spread function of an optical spectrum analyzer (OSA) and the relative intensity of closely spaced spectral lines. In this paper, we propose a boosted iterative deconvolution (BID) method to resolve the intrinsic modulation of spectral lines from the measured optical carrier and modulation spectra. In our scheme, the electro-optic modulation spectrum is considered the convolution of the optical carrier spectrum and the intrinsic δ-function modulation spectrum, and the BID method enables fast and accurate extraction of the δ-function spectral lines from the measured modulation spectrum. The proof-of-concept experiment demonstrates that our method can improve the resolution of OSA by 10–30 p.m. at different relative intensities, with a best resolution of 10 p.m. in the iso-intensity case and wavelength errors of less than 2 p.m., which largely improves the measurement resolution and accuracy of the modulation spectrum.
