Reliability-Enhanced Camera Lens Module Classification Using Semi-Supervised Regression Method

Abstract

Artificial intelligence has become the primary issue in the era of Industry 4.0, accelerating the realization of a self-driven smart factory. It is transforming various manufacturing sectors including the assembly line for a camera lens module. The recent development of bezel-less smartphones necessitates a large-scale production of the camera lens module. However, assembling the necessary parts of a module needs much room to be improved since the procedure followed by its inspection is costly and time-consuming. Consequently, the collection of labeled data is often limited. In this study, a reliable means to predict the state of an unseen camera lens module using simple semi-supervised regression is proposed. Here, an experimental study to investigate the effect of different numbers of training samples is demonstrated. The increased amount of data using simple pseudo-labeling means is shown to improve the general performance of deep neural network for the prediction of Modulation Transfer Function (MTF) by as much as 18%, 15% and 25% in terms of RMSE, MAE and R squared. The cross-validation technique is used to ensure a generalized predictive performance. Furthermore, binary classification is conducted based on a threshold value for MTF to finally demonstrate the better prediction outcome in a real-world scenario. As a result, the overall accuracy, recall, specificity and f1-score are increased by 11.3%, 9%, 1.6% and 7.6% showing that the classification of camera lens module has been improved through the suggested semi-supervised regression method.

Keywords

• semi-supervised regression
• camera lens module
• pseudo-label
• deep neural network
• modular transfer function