Applied signal effect in the potentiometric method on the resistance measurements accuracy

Abstract

In this paper, the effect of applying dc voltage and dc current sources in using the potentiometric method on the accuracy and the uncertainty of the resistance measurements is studied. This study is done practically for the low and high values of standard resistance ranges from 100 to 10 MΩ. The traceability chain for the used resistors is introduced by using the standard resistors 1 Ω Thomas type, 10 kΩ model SR104, and four Hamon transfer standards. The system operation is remotely controlled by using a LabVIEW program to improve the performance. The measurement results and the uncertainty estimation values are discussed to identify the effect of the applied voltage and current on the different resistance ranges measurement.

Keywords

• resistance measurement
• potentiometric method
• LabVIEW program
• traceability chain
• measurement uncertainty