Resistance contact thin-film resistor

Abstract

The analytical model of the calculation of the contact resistance of the thin-film resistor is Offered. The Explored dependency of the contact resistance from wedge of the pickling. The Considered influence adhesive layer on warm-up stability of the resistor. They Are Received formulas of the calculation systematic and casual inaccuracy contributed by contact resistance.

Keywords

• fractal
• scaling
• fractional operators
• fractal wireless systems