Nature Communications (Jun 2018)

Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

  • Kevin Vynck,
  • Nicholas J. Dinsdale,
  • Bigeng Chen,
  • Roman Bruck,
  • Ali Z. Khokhar,
  • Scott A. Reynolds,
  • Lee Crudgington,
  • David J. Thomson,
  • Graham T. Reed,
  • Philippe Lalanne,
  • Otto L. Muskens

DOI
https://doi.org/10.1038/s41467-018-04662-2
Journal volume & issue
Vol. 9, no. 1
pp. 1 – 10

Abstract

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Advanced photonic probes are important for the development of non-contact wafer-scale testing of photonic chips. Here, Vynck et al. develop a quantitative technique based on mapping of transmittance variations by ultrafast perturbations to analyze arbitrary linear multi-port photonic devices.