The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences (Aug 2020)

DEFORMATION MONITORING USING SAR INTERFEROMETRY AND ACTIVE AND PASSIVE REFLECTORS

  • M. Crosetto,
  • G. Luzi,
  • O. Monserrat,
  • A. Barra,
  • M. Cuevas-González,
  • R. Palamá,
  • V. Krishnakumar,
  • Y. Wassie,
  • S. M. Mirmazloumi,
  • P. Espín-López,
  • B. Crippa

DOI
https://doi.org/10.5194/isprs-archives-XLIII-B3-2020-287-2020
Journal volume & issue
Vol. XLIII-B3-2020
pp. 287 – 292

Abstract

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This paper is focused on SAR interferometry for deformation monitoring, based on the use of passive and active reflectors. Such reflectors are needed in all cases where a sufficient response from the ground is not available. In particular, the paper describes the development of a low-cost active reflector. This development was carried out in an EU H2020 project called GIMS. The paper summarizes the key characteristics of the developed active reflector. The reflector was tested in two main experiments: the first one located in the campus of CTTC and the second one in a GIMS test site located in Slovenia. The experiments demonstrate the visibility of the active reflectors and provide the first results concerning the phase stability of such devices.