Digital-SMLM for precisely localizing emitters within the diffraction limit
Jia Zhe,
Zhou Lingxiao,
Li Haoyu,
Ni Jielei,
Chen Danni,
Guo Dongfei,
Cao Bo,
Liu Gang,
Liang Guotao,
Zhou Qianwen,
Yuan Xiaocong,
Ni Yanxiang
Affiliations
Jia Zhe
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Zhou Lingxiao
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Li Haoyu
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Ni Jielei
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Chen Danni
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Guo Dongfei
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Cao Bo
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Liu Gang
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Liang Guotao
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Zhou Qianwen
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Yuan Xiaocong
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Ni Yanxiang
Nanophotonics Research Center, Institute of Microscale Optoelectronics & State Key Laboratory of Radio Frequency Heterogeneous Integration, College of Physics and Optoelectronic Engineering & Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, 47890Shenzhen University, Shenzhen518060, China
Precisely pinpointing the positions of emitters within the diffraction limit is crucial for quantitative analysis or molecular mechanism investigation in biomedical research but has remained challenging unless exploiting single molecule localization microscopy (SMLM). Via integrating experimental spot dataset with deep learning, we develop a new approach, Digital-SMLM, to accurately predict emitter numbers and positions for sub-diffraction-limit spots with an accuracy of up to 98 % and a root mean square error as low as 14 nm. Digital-SMLM can accurately resolve two emitters at a close distance, e.g. 30 nm. Digital-SMLM outperforms Deep-STORM in predicting emitter numbers and positions for sub-diffraction-limited spots and recovering the ground truth distribution of molecules of interest. We have validated the generalization capability of Digital-SMLM using independent experimental data. Furthermore, Digital-SMLM complements SMLM by providing more accurate event number and precise emitter positions, enabling SMLM to closely approximate the natural state of high-density cellular structures.
