Beilstein Journal of Nanotechnology (Dec 2012)

Advanced atomic force microscopy techniques

  • Thilo Glatzel,
  • Hendrik Hölscher,
  • Thomas Schimmel,
  • Mehmet Z. Baykara,
  • Udo D. Schwarz,
  • Ricardo Garcia

DOI
https://doi.org/10.3762/bjnano.3.99
Journal volume & issue
Vol. 3, no. 1
pp. 893 – 894

Abstract

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Keywords