AIP Advances (Jul 2018)

Residual-free reactive ion etching of gold layers

  • Gerhard Franz,
  • Wolfhard Oberhausen,
  • Ralf Meyer,
  • Markus-Christian Amann

DOI
https://doi.org/10.1063/1.5037886
Journal volume & issue
Vol. 8, no. 7
pp. 075026 – 075026-8

Abstract

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Metal contacts on semiconductors devices are normally defined by lift-off process, because no well-defined etch processes exist for some rare metals. In this work, an RIE process for gold contacts is introduced which requires a high-density plasma, generated by electron cyclotron resonance. The proof is given by the residual-free etching without fence-generation and micromasking in the vicinity of the mask.