Investigating the properties of tin-oxide thin film developed by sputtering process for perovskite solar cells

Abstract

Abstract Tin oxide (SnO2) nano-crystalline thin films were deposited on silicon and glass substrates at room temperature by sputtering at a constant power of 30 W and different working pressure of 10, 7, and 5 mTorr. Surface morphology, electrical and optical properties of the films were investigated to optimise the deposition condition of the films as electron transport layer (ETL) for high-power conversion efficiency perovskite solar cells. The films were characterized by scanning electron microscopy (SEM), UV–Vis–NIR Spectrophotometer, and Four-point probe. SnO2 films obtained at working pressure of 10 mTorr exhibited uniform surface morphology with high light transmittance (90%) and conductivity (4 S/m). These sputtered SnO2 films appeared to have shown promising properties as ETL for PSC, and further investigation is justified to establish the optimal fabrication parameters and resulting energy conversion efficiency.

Keywords

• Sputtering
• Tin oxide
• Electron transport layer
• Thin films
• SEM
• Perovskite solar cells