AIP Advances (Feb 2016)

One electron-controlled multiple-valued dynamic random-access-memory

  • H. W. Kye,
  • B. N. Song,
  • S. E. Lee,
  • J. S. Kim,
  • S. J. Shin,
  • J. B. Choi,
  • Y.-S. Yu,
  • Y. Takahashi

DOI
https://doi.org/10.1063/1.4942901
Journal volume & issue
Vol. 6, no. 2
pp. 025320 – 025320-5

Abstract

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We propose a new architecture for a dynamic random-access-memory (DRAM) capable of storing multiple values by using a single-electron transistor (SET). The gate of a SET is designed to be connected to a plurality of DRAM unit cells that are arrayed at intersections of word lines and bitlines. In this SET-DRAM hybrid scheme, the multiple switching characteristics of SET enables multiple value data stored in a DRAM unit cell, and this increases the storage functionality of the device. Moreover, since refreshing data requires only a small amount of SET driving current, this enables device operating with low standby power consumption.