Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers

• Haruki Uchiyama,
• Soya Saijo,
• Shigeru Kishimoto,
• Junko Ishi-Hayase,
• Yutaka Ohno

Affiliations

Haruki Uchiyama

Department of Electronics, Nagoya University, Nagoya, Japan

Soya Saijo

School of Fundamental Science and Technology, Keio University, Yokohama, Kanagawa, Japan

Shigeru Kishimoto

Department of Electronics, Nagoya University, Nagoya, Japan

Junko Ishi-Hayase

School of Fundamental Science and Technology, Keio University, Yokohama, Kanagawa, Japan

Yutaka Ohno

Department of Electronics, Nagoya University, Nagoya, Japan